Characterization of thin dielectric films containing nanocrystals or nanoparticles
In this project, the optical properties of NiO thin film, which is embedded with nanocrystals Ni, is investigated. Three Ni-rich NiO thin film samples which are synthesized by different sputtering power and duration are granted to this project. The Spectroscopic Ellipsometry (SE) was employed to obt...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2012
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| Online Access: | http://hdl.handle.net/10356/49427 |