Characterization of thin dielectric films containing nanocrystals or nanoparticles
In this project, the optical properties of NiO thin film, which is embedded with nanocrystals Ni, is investigated. Three Ni-rich NiO thin film samples which are synthesized by different sputtering power and duration are granted to this project. The Spectroscopic Ellipsometry (SE) was employed to obt...
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| Other Authors: | |
| Format: | Final Year Project (FYP) |
| Language: | English |
| Published: |
2012
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| Online Access: | http://hdl.handle.net/10356/49427 |
| _version_ | 1826123519816105984 |
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| author | Yap, Poh Ling. |
| author2 | Chen Tupei |
| author_facet | Chen Tupei Yap, Poh Ling. |
| author_sort | Yap, Poh Ling. |
| collection | NTU |
| description | In this project, the optical properties of NiO thin film, which is embedded with nanocrystals Ni, is investigated. Three Ni-rich NiO thin film samples which are synthesized by different sputtering power and duration are granted to this project. The Spectroscopic Ellipsometry (SE) was employed to obtain the ellipsometry angles for spectral fitting purpose. The SE measurements were carried out at three incident angle (65o, 70o, 75o) for each sample from the spectral range of 250nm to 1100nm. Besides that, the dielectric dispersion models used in this project are Tauc-Lorentz model and Forouhi-Bloomer model. The fitting parameters are shown in this project and the spectral fittings obtained were analyzed for qualification of band gap and film thickness extraction purpose. Hence, the physic behind the optical constant is elaborated and the performances for the two models are compared. |
| first_indexed | 2024-10-01T06:06:00Z |
| format | Final Year Project (FYP) |
| id | ntu-10356/49427 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T06:06:00Z |
| publishDate | 2012 |
| record_format | dspace |
| spelling | ntu-10356/494272023-07-07T16:03:28Z Characterization of thin dielectric films containing nanocrystals or nanoparticles Yap, Poh Ling. Chen Tupei School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics In this project, the optical properties of NiO thin film, which is embedded with nanocrystals Ni, is investigated. Three Ni-rich NiO thin film samples which are synthesized by different sputtering power and duration are granted to this project. The Spectroscopic Ellipsometry (SE) was employed to obtain the ellipsometry angles for spectral fitting purpose. The SE measurements were carried out at three incident angle (65o, 70o, 75o) for each sample from the spectral range of 250nm to 1100nm. Besides that, the dielectric dispersion models used in this project are Tauc-Lorentz model and Forouhi-Bloomer model. The fitting parameters are shown in this project and the spectral fittings obtained were analyzed for qualification of band gap and film thickness extraction purpose. Hence, the physic behind the optical constant is elaborated and the performances for the two models are compared. Bachelor of Engineering 2012-05-18T06:46:05Z 2012-05-18T06:46:05Z 2012 2012 Final Year Project (FYP) http://hdl.handle.net/10356/49427 en Nanyang Technological University 80 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics Yap, Poh Ling. Characterization of thin dielectric films containing nanocrystals or nanoparticles |
| title | Characterization of thin dielectric films containing nanocrystals or nanoparticles |
| title_full | Characterization of thin dielectric films containing nanocrystals or nanoparticles |
| title_fullStr | Characterization of thin dielectric films containing nanocrystals or nanoparticles |
| title_full_unstemmed | Characterization of thin dielectric films containing nanocrystals or nanoparticles |
| title_short | Characterization of thin dielectric films containing nanocrystals or nanoparticles |
| title_sort | characterization of thin dielectric films containing nanocrystals or nanoparticles |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics |
| url | http://hdl.handle.net/10356/49427 |
| work_keys_str_mv | AT yappohling characterizationofthindielectricfilmscontainingnanocrystalsornanoparticles |