Design of process variation-tolerant circuits
This report emphasises on the 6T Static Random Access Memory (SRAM). It describes the basic theory of the SRAM, the concepts of measuring degradation in digital circuits as well as effects of wordline modulation to mitigate the impact of the combined effect of Negative Bias Temperature Instability (...
| Príomhchruthaitheoir: | |
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| Rannpháirtithe: | |
| Formáid: | Final Year Project (FYP) |
| Teanga: | English |
| Foilsithe / Cruthaithe: |
2012
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| Ábhair: | |
| Rochtain ar líne: | http://hdl.handle.net/10356/50088 |