Reliability of copper wire bonding

In this research, it is to investigate the reliability of the copper contact in chips to see if it is a viable possibility that it can replace gold bonding.

Bibliographic Details
Main Author: Ang, Joash Wei Qiang
Other Authors: Tang Xiaohong
Format: Final Year Project (FYP)
Language:English
Published: 2012
Subjects:
Online Access:http://hdl.handle.net/10356/50233