Investigation of different NBTI simulation models
Negative Bias Temperature Instability (NBTI) is an important reliability concern since integrated circuit technology has entered the ultra-scaled CMOS technology node. This phenomenon arises from traps generation at the dielectric-substrate interface under the presence of electric field and high tem...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2012
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| Online Access: | http://hdl.handle.net/10356/50346 |