Nanometric material removal using electrokinetic phenomenon
Material removal at the sub-micron level has been a topic of interest in the past few years, particularly with respect to the fabrication of miniaturized devices. While numerous techniques have been developed and refined from their larger meso-scale counterparts (e.g. polishing), most have inherent...
Main Author: | Leo, Cheng Seng |
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Other Authors: | Yang Chun, Charles |
Format: | Thesis |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/50630 |
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