A study on the orientated growth, microstructure and thermal conductivity of RF reactively sputtered AIN films

In this study AIN films have been deposited by reactive sputtering in argon and nitrogen gas mixture. The orientated growth in the sputtered AIN films has been systematically studied.

Bibliographic Details
Main Author: Cheng, Hao
Other Authors: Peter Hing
Format: Thesis
Published: 2008
Subjects:
Online Access:https://hdl.handle.net/10356/5098