Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors

In this work, the Electron Backscattered Diffraction technique was employed to obtain the crystallographic orientation distribution, determine the misorientation of grain boundaries and also map the misorientation distribution in Bi-2223 superconductor tapes.

Detalhes bibliográficos
Autor principal: Tan, Thiam Teck.
Outros Autores: Li, Sean Suixiang
Formato: Tese
Publicado em: 2008
Assuntos:
Acesso em linha:http://hdl.handle.net/10356/5112