Study of leakage and degradation in metal nanocrystal-embedded gate stacks
Nanocrystal (NC) memories have attracted a lot of research attentions as a promising candidate to reduce defect-related charge loss and to overcome scaling limitation in conventional floating gate memories. Most work on metal nanocrystal (MNC) has focused primarily on the materials and fabrication i...
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| Format: | Thesis |
| Language: | English |
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2013
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| Online Access: | https://hdl.handle.net/10356/53456 |