Investigation of multilayer thin films using ellipsometry
Light emission from silicon-based materials is a very important research area for optoelectronic and display applications. It is important to derive a practical light source from silicon in order to have complete photonic integrated circuits on silicon. An efficient silicon based light emitting devi...
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| Format: | Thesis |
| Language: | English |
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2013
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| Online Access: | http://hdl.handle.net/10356/53469 |