Nanoscale measurement by using the near-field polarization
This thesis studies the polarization representations of near-field light for 3D nano-scale measurement and resolution improvement of SNOM imaging. The work is performed from two aspects. One aspect is to achieve optical measurements and thin film characterizations by using polarization-based SNOM. T...
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| Format: | Thesis |
| Language: | English |
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2013
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| Online Access: | http://hdl.handle.net/10356/53737 |