Fault diagnose based on pattern recognition

This is a joint project with SIMTech. It is mainly focusing on developing a fault diagnose system. The system can be used to solve stochastic and dynamical problems, like bank abnormal transaction detection, operation abnormal event detection and equipment failure event detection. This system fir...

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Bibliographic Details
Main Author: Liu, Zhuoshi.
Other Authors: Wang Dan Wei
Format: Final Year Project (FYP)
Language:English
Published: 2013
Subjects:
Online Access:http://hdl.handle.net/10356/54355