Fault diagnose based on pattern recognition

This is a joint project with SIMTech. It is mainly focusing on developing a fault diagnose system. The system can be used to solve stochastic and dynamical problems, like bank abnormal transaction detection, operation abnormal event detection and equipment failure event detection. This system fir...

全面介绍

书目详细资料
主要作者: Liu, Zhuoshi.
其他作者: Wang Dan Wei
格式: Final Year Project (FYP)
语言:English
出版: 2013
主题:
在线阅读:http://hdl.handle.net/10356/54355