Fault diagnose based on pattern recognition
This is a joint project with SIMTech. It is mainly focusing on developing a fault diagnose system. The system can be used to solve stochastic and dynamical problems, like bank abnormal transaction detection, operation abnormal event detection and equipment failure event detection. This system fir...
Main Author: | Liu, Zhuoshi. |
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Other Authors: | Wang Dan Wei |
Format: | Final Year Project (FYP) |
Language: | English |
Published: |
2013
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/54355 |
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