Leakage reduction techniques for submicron CMOS circuits
Leakage current has become a significant problem in sub-micron circuits due to the continuous scaling of channel length. Therefore, leakage reduction has become an essential design process in order to achieve a better performance especially in low power circuit applications. Leakage cont...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2013
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| Online Access: | http://hdl.handle.net/10356/54459 |