Artefact removal for neonatal electroencephalogram
Neonatal electroencephalogram (EEG) provides vital diagnostic/prognostic insight. Apartnfrom vigilant state (e.g. induced by seizure, Central Nervous System diseases etc.) detection, it is also the cornerstone in Sleep-Wake-Cycle (SWC) recognition. SWC recognition holds great clinical significance a...
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| フォーマット: | Final Year Project (FYP) |
| 言語: | English |
| 出版事項: |
2013
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| オンライン･アクセス: | http://hdl.handle.net/10356/54471 |