Investigation of resistive switching and conduction mechanisms in oxide-based RRAM device for emerging nonvolatile memory applications

This thesis introduces fabrication and physical as well as electrical characterizations of oxide-based resistive random access memory (RRAM) which has been recently explored as one of the most promising nonvolatile memory technology. The objective of this thesis focus on the device fabrication and i...

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Bibliographic Details
Main Author: Fang, Zheng
Other Authors: Yu Hongyu
Format: Thesis
Language:English
Published: 2013
Subjects:
Online Access:https://hdl.handle.net/10356/54664