Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images...
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| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/5541 |