Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images...
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| Формат: | Диссертация |
| Опубликовано: |
2008
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| Online-ссылка: | http://hdl.handle.net/10356/5541 |
| _version_ | 1826116250597588992 |
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| author | Zhang, Yilu. |
| author2 | Guo, Ningqun |
| author_facet | Guo, Ningqun Zhang, Yilu. |
| author_sort | Zhang, Yilu. |
| collection | NTU |
| description | This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images and are compared with the results obtained with classical operators in normal and speckle noise conditions. Then two ways to obtain the size and location of defects are obtained by using blob-coloring to process the map obtained by the Variational method. |
| first_indexed | 2024-10-01T04:08:16Z |
| format | Thesis |
| id | ntu-10356/5541 |
| institution | Nanyang Technological University |
| last_indexed | 2024-10-01T04:08:16Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/55412023-03-11T17:22:51Z Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images Zhang, Yilu. Guo, Ningqun School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images and are compared with the results obtained with classical operators in normal and speckle noise conditions. Then two ways to obtain the size and location of defects are obtained by using blob-coloring to process the map obtained by the Variational method. Master of Engineering (MPE) 2008-09-17T10:53:02Z 2008-09-17T10:53:02Z 2003 2003 Thesis http://hdl.handle.net/10356/5541 Nanyang Technological University application/pdf |
| spellingShingle | DRNTU::Engineering::Manufacturing Zhang, Yilu. Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images |
| title | Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images |
| title_full | Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images |
| title_fullStr | Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images |
| title_full_unstemmed | Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images |
| title_short | Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images |
| title_sort | applications of automated defects recognition in ic packaging based on ultrasound c sam images |
| topic | DRNTU::Engineering::Manufacturing |
| url | http://hdl.handle.net/10356/5541 |
| work_keys_str_mv | AT zhangyilu applicationsofautomateddefectsrecognitioninicpackagingbasedonultrasoundcsamimages |