Optical characterization of conductive metal oxide thin films
Thickness dependent and growth temperature dependent ZnO thin film optical properties (complex dielectric function, band gap energy and exciton binding energy) have been studied by using spectroscopic ellipsometry (SE) based on Yoshikawa and Adachi’s model. Comparing with bulk ZnO material, ZnO thin...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2014
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| Online Access: | http://hdl.handle.net/10356/60431 |