Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production

This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and hu...

Полное описание

Библиографические подробности
Главные авторы: N. B. Vignesh, Zhong, Yi, Che, Yi
Другие авторы: Yue Chee Yoon
Формат: Диссертация
Язык:English
Опубликовано: 2014
Предметы:
Online-ссылка:http://hdl.handle.net/10356/60715