Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and hu...
| Главные авторы: | , , |
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| Другие авторы: | |
| Формат: | Диссертация |
| Язык: | English |
| Опубликовано: |
2014
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| Предметы: | |
| Online-ссылка: | http://hdl.handle.net/10356/60715 |