Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and hu...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
2014
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| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/60715 |
| _version_ | 1826114593639890944 |
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| author | N. B. Vignesh Zhong, Yi Che, Yi |
| author2 | Yue Chee Yoon |
| author_facet | Yue Chee Yoon N. B. Vignesh Zhong, Yi Che, Yi |
| author_sort | N. B. Vignesh |
| collection | NTU |
| description | This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and humidity with increased sampling rate provides a higher resolution and is far more effective in understanding the degradation mechanisms of semiconductor interconnects. Thus the new system provides a good predictive capability of the Mean Time to Failure (MTF) of adhesive interconnects. Also the present system isn't friendly enough for data handling and interpretation. Hence separate programs called - 'Real World & Deeper Analysis' have been developed for easy data handling and analysis. |
| first_indexed | 2024-10-01T03:41:40Z |
| format | Thesis |
| id | ntu-10356/60715 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T03:41:40Z |
| publishDate | 2014 |
| record_format | dspace |
| spelling | ntu-10356/607152020-11-01T11:29:39Z Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production N. B. Vignesh Zhong, Yi Che, Yi Yue Chee Yoon School of Mechanical and Aerospace Engineering Singapore-MIT Alliance Programme DRNTU::Engineering::Manufacturing This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and humidity with increased sampling rate provides a higher resolution and is far more effective in understanding the degradation mechanisms of semiconductor interconnects. Thus the new system provides a good predictive capability of the Mean Time to Failure (MTF) of adhesive interconnects. Also the present system isn't friendly enough for data handling and interpretation. Hence separate programs called - 'Real World & Deeper Analysis' have been developed for easy data handling and analysis. Master of Science (IMST) 2014-05-29T06:58:46Z 2014-05-29T06:58:46Z 2004 2004 Thesis http://hdl.handle.net/10356/60715 en 117 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Manufacturing N. B. Vignesh Zhong, Yi Che, Yi Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production |
| title | Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production |
| title_full | Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production |
| title_fullStr | Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production |
| title_full_unstemmed | Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production |
| title_short | Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production |
| title_sort | exploring enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production |
| topic | DRNTU::Engineering::Manufacturing |
| url | http://hdl.handle.net/10356/60715 |
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