Non-mechanical and instantaneous phase-shifting technique for surface profiling

In this research work, a novel method is proposed to achieve non-contact surface profile measurement of ultra-flat surfaces. Resolution and accuracy in nanometer range is attained using non-mechanical and instantaneous phase shifting interferometry This work explores the applicability of instantane...

Fuld beskrivelse

Bibliografiske detaljer
Hovedforfatter: Narayanswamy R. Sivakumar
Andre forfattere: Ngoi, Bryan Kok Ann
Format: Thesis
Udgivet: 2008
Fag:
Online adgang:http://hdl.handle.net/10356/6180