Piezoresponse force microscopy characterization of PbZr0.52Ti0.48O3 thin films deposited by sol-gel and pulsed laser deposition

Piezoresponse force microscopy characterization of PbZr0.52Ti0.48O3 thin films deposited by sol-gel and pulsed laser deposition

In this report, PbZr0.52Ti0.48O3 thin films deposited via sol-gel method and pulsed laser deposition (PLD) were investigated using Piezoresponse Force Microscopy (PFM) for microscopic piezoelectric characteristic measurements. Electrical properties including dielectric, ferroelectric, and piezoelect...

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Bibliographic Details
Main Author: Tan, Jun Ming
Other Authors: Chen Lang
Format: Final Year Project (FYP)
Language:English
Published: 2015
Subjects:
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Online Access:http://hdl.handle.net/10356/62008

Internet

http://hdl.handle.net/10356/62008

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