Radiation hardened ICs
This final year project develops a new Radiation-Hardened-By-Design approach to detect Single Event Latchup (SEL) by monitoring the transient current slope, which is proven with reliable immunity to SEL. The object is to reduce the cost of Radiation-Hardened-By-Process technique by benefiting from t...
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| Format: | Final Year Project (FYP) |
| Language: | English |
| Published: |
2015
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| Online Access: | http://hdl.handle.net/10356/64405 |