Study of sputtered tin schottky barrier diode for Gan-hemt applications

During the past two decades, GaN-based high electron mobility transistor (HEMT) has been identified to be a very promising transistor that is able to realize the applications of high voltage, high frequency, and high temperature and has drawn much research interest around the world. More recently, G...

Full description

Bibliographic Details
Main Author: Li, Kang
Other Authors: Ng Geok Ing
Format: Thesis
Language:English
Published: 2016
Subjects:
Online Access:http://hdl.handle.net/10356/68961