Analysis of memory BIST architecture flow
The burgeoning amount and complexity of memories in modern SoC have brought forth new challenges in memory testing. Memory Built-in self-test (BIST) is the most widely used solution for memory testing. MBIST is defined as a method used for insertion of embedded memory controllers inside the chip to...
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| Format: | Thesis |
| Language: | English |
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2018
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| Online Access: | http://hdl.handle.net/10356/76070 |