Classification of defects in semiconductor wafer using artificial intelligence
Machine learning, a subset of artificial intelligence is an emerging technology that enabled the classification of objects without the need of being explicitly programmed. Due to the popularity of artificial intelligence, many frameworks were invented. ANN, CNN, Faster RCNN will be explained t...
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| Format: | Final Year Project (FYP) |
| Langue: | English |
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2019
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| Accès en ligne: | http://hdl.handle.net/10356/78800 |