Multi-colour microscopic interferometry for optical metrology and imaging applications
Interferometry has been widely used for optical metrology and imaging applications because of their precision, reliability, and versatility. Although single-wavelength interferometery can provide high sensitivity and resolution, it has several drawbacks, namely, it fails to quantify large-discontinu...
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2016
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/80246 http://hdl.handle.net/10220/40566 |
| _version_ | 1811697034526195712 |
|---|---|
| author | Upputuri, Paul Kumar Pramanik, Manojit Nandigana, Krishna Mohan Kothiyal, Mahendra Prasad |
| author2 | School of Chemical and Biomedical Engineering |
| author_facet | School of Chemical and Biomedical Engineering Upputuri, Paul Kumar Pramanik, Manojit Nandigana, Krishna Mohan Kothiyal, Mahendra Prasad |
| author_sort | Upputuri, Paul Kumar |
| collection | NTU |
| description | Interferometry has been widely used for optical metrology and imaging applications because of their precision, reliability, and versatility. Although single-wavelength interferometery can provide high sensitivity and resolution, it has several drawbacks, namely, it fails to quantify large-discontinuities, large-deformations, and shape of unpolished surfaces. Multiple-wavelength techniques have been successfully used to overcome the drawbacks associated with single wavelength analysis. The use of colour CCD camera allows simultaneous acquisition of multiple interferograms. The advances in colour CCD cameras and image processing techniques have made the multi-colour interferometry a faster, simpler, and cost-effective tool for industrial applications. This article reviews the recent advances in multi-colour interferometric techniques and their demanding applications for characterization of micro-systems, non-destructive testing, and bio-imaging applications. |
| first_indexed | 2024-10-01T07:48:50Z |
| format | Journal Article |
| id | ntu-10356/80246 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T07:48:50Z |
| publishDate | 2016 |
| record_format | dspace |
| spelling | ntu-10356/802462023-12-29T06:52:52Z Multi-colour microscopic interferometry for optical metrology and imaging applications Upputuri, Paul Kumar Pramanik, Manojit Nandigana, Krishna Mohan Kothiyal, Mahendra Prasad School of Chemical and Biomedical Engineering Interferometry Multiple-wavelength Colour CCD Microsystems Bio-imaging Interferometry has been widely used for optical metrology and imaging applications because of their precision, reliability, and versatility. Although single-wavelength interferometery can provide high sensitivity and resolution, it has several drawbacks, namely, it fails to quantify large-discontinuities, large-deformations, and shape of unpolished surfaces. Multiple-wavelength techniques have been successfully used to overcome the drawbacks associated with single wavelength analysis. The use of colour CCD camera allows simultaneous acquisition of multiple interferograms. The advances in colour CCD cameras and image processing techniques have made the multi-colour interferometry a faster, simpler, and cost-effective tool for industrial applications. This article reviews the recent advances in multi-colour interferometric techniques and their demanding applications for characterization of micro-systems, non-destructive testing, and bio-imaging applications. MOE (Min. of Education, S’pore) Accepted version 2016-05-23T07:33:18Z 2019-12-06T13:45:45Z 2016-05-23T07:33:18Z 2019-12-06T13:45:45Z 2016 2016 Journal Article 0143-8166 https://hdl.handle.net/10356/80246 http://hdl.handle.net/10220/40566 10.1016/j.optlaseng.2016.03.020 190763 en Optics and Lasers in Engineering © 2016 Elsevier Ltd. This is the author created version of a work that has been peer reviewed and accepted for publication by Optics and Lasers in Engineering, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.optlaseng.2016.03.020]. application/pdf |
| spellingShingle | Interferometry Multiple-wavelength Colour CCD Microsystems Bio-imaging Upputuri, Paul Kumar Pramanik, Manojit Nandigana, Krishna Mohan Kothiyal, Mahendra Prasad Multi-colour microscopic interferometry for optical metrology and imaging applications |
| title | Multi-colour microscopic interferometry for optical metrology and imaging applications |
| title_full | Multi-colour microscopic interferometry for optical metrology and imaging applications |
| title_fullStr | Multi-colour microscopic interferometry for optical metrology and imaging applications |
| title_full_unstemmed | Multi-colour microscopic interferometry for optical metrology and imaging applications |
| title_short | Multi-colour microscopic interferometry for optical metrology and imaging applications |
| title_sort | multi colour microscopic interferometry for optical metrology and imaging applications |
| topic | Interferometry Multiple-wavelength Colour CCD Microsystems Bio-imaging |
| url | https://hdl.handle.net/10356/80246 http://hdl.handle.net/10220/40566 |
| work_keys_str_mv | AT upputuripaulkumar multicolourmicroscopicinterferometryforopticalmetrologyandimagingapplications AT pramanikmanojit multicolourmicroscopicinterferometryforopticalmetrologyandimagingapplications AT nandiganakrishnamohan multicolourmicroscopicinterferometryforopticalmetrologyandimagingapplications AT kothiyalmahendraprasad multicolourmicroscopicinterferometryforopticalmetrologyandimagingapplications |