Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller

Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would...

Volledige beschrijving

Bibliografische gegevens
Hoofdauteurs: Breier, Jakub, Jap, Dirmanto
Andere auteurs: School of Physical and Mathematical Sciences
Formaat: Conference Paper
Taal:English
Gepubliceerd in: 2016
Onderwerpen:
Online toegang:https://hdl.handle.net/10356/80627
http://hdl.handle.net/10220/40619