Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller
Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Conference Paper |
| Language: | English |
| Published: |
2016
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| Online Access: | https://hdl.handle.net/10356/80627 http://hdl.handle.net/10220/40619 |
| _version_ | 1811678185000009728 |
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| author | Breier, Jakub Jap, Dirmanto |
| author2 | School of Physical and Mathematical Sciences |
| author_facet | School of Physical and Mathematical Sciences Breier, Jakub Jap, Dirmanto |
| author_sort | Breier, Jakub |
| collection | NTU |
| description | Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would like to investigate the practicability of the back-side laser fault injection and to state benefits and drawbacks of this technique. We performed experiments on two methods of fault injections induced by a laser beam -- instruction disturbance experiments and register value changes. The first method, as our experiments show, is easy to perform, precise and repeatable. The second one is harder to perform and we could not achieve repeatability in such experiments. |
| first_indexed | 2024-10-01T02:49:14Z |
| format | Conference Paper |
| id | ntu-10356/80627 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T02:49:14Z |
| publishDate | 2016 |
| record_format | dspace |
| spelling | ntu-10356/806272020-09-26T22:15:04Z Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller Breier, Jakub Jap, Dirmanto School of Physical and Mathematical Sciences Proceedings of the WESS'15: Workshop on Embedded Systems Security Temasek Laboratories Laser Fault Attack ATmega328P Laser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would like to investigate the practicability of the back-side laser fault injection and to state benefits and drawbacks of this technique. We performed experiments on two methods of fault injections induced by a laser beam -- instruction disturbance experiments and register value changes. The first method, as our experiments show, is easy to perform, precise and repeatable. The second one is harder to perform and we could not achieve repeatability in such experiments. Accepted version 2016-06-06T09:05:14Z 2019-12-06T13:53:28Z 2016-06-06T09:05:14Z 2019-12-06T13:53:28Z 2015 2015 Conference Paper Breier, J., & Jap, D. (2015). Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller. Proceedings of the WESS'15: Workshop on Embedded Systems Security, 5-. https://hdl.handle.net/10356/80627 http://hdl.handle.net/10220/40619 10.1145/2818362.2818367 193451 en © 2015 Association for Computing Machinery (ACM). This is the author created version of a work that has been peer reviewed and accepted for publication by Proceedings of the WESS'15: Workshop on Embedded Systems Security, Association for Computing Machinery (ACM). It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1145/2818362.2818367]. application/pdf |
| spellingShingle | Laser Fault Attack ATmega328P Breier, Jakub Jap, Dirmanto Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller |
| title | Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller |
| title_full | Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller |
| title_fullStr | Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller |
| title_full_unstemmed | Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller |
| title_short | Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller |
| title_sort | testing feasibility of back side laser fault injection on a microcontroller |
| topic | Laser Fault Attack ATmega328P |
| url | https://hdl.handle.net/10356/80627 http://hdl.handle.net/10220/40619 |
| work_keys_str_mv | AT breierjakub testingfeasibilityofbacksidelaserfaultinjectiononamicrocontroller AT japdirmanto testingfeasibilityofbacksidelaserfaultinjectiononamicrocontroller |