APA (7th ed.) Citation

Gao, Y., Lee, H., Jiao, J., Chun, B. J., Kim, S., Kim, D., . . . Engineering, S. o. M. a. A. (2019). Surface third and fifth harmonic generation at crystalline Si for non-invasive inspection of Si wafer’s inter-layer defects.

Chicago Style (17th ed.) Citation

Gao, Yi, Hyub Lee, Jiannan Jiao, Byung Jae Chun, Seungchul Kim, Dong-Hwan Kim, Young-Jin Kim, and School of Mechanical and Aerospace Engineering. Surface Third and Fifth Harmonic Generation at Crystalline Si for Non-invasive Inspection of Si Wafer’s Inter-layer Defects. 2019.

MLA (9th ed.) Citation

Gao, Yi, et al. Surface Third and Fifth Harmonic Generation at Crystalline Si for Non-invasive Inspection of Si Wafer’s Inter-layer Defects. 2019.