Resolving the Pinning Force of Nanobubbles with Optical Microscopy
Many of the remarkable properties of surface nanobubbles, such as unusually small contact angles and long lifetimes, are related to the force that pins them onto their substrates. This pinning force is yet to be quantified experimentally. Here, surface-attached nanobubbles are pulled with an atomic...
Main Authors: | Tan, Beng Hau, An, Hongjie, Ohl, Claus-Dieter |
---|---|
Other Authors: | School of Physical and Mathematical Sciences |
Format: | Journal Article |
Language: | English |
Published: |
2017
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/83362 http://hdl.handle.net/10220/42573 |
Similar Items
-
On-surface stereochemical characterization of a highly curved chiral nanographene by noncontact atomic force microscopy and scanning tunneling microscopy
by: Zhong, Qigang, et al.
Published: (2024) -
Unveiling the layered structure of sulfobetaine polymer brushes through bimodal atomic force microscopy
by: Mondarte, Evan Angelo Quimada, et al.
Published: (2023) -
Fabrication and simulation of P-type junctionless silicon nanowire transistor using silicon on insulator and atomic force microscope nano lithography
by: Dehzangi, Arash
Published: (2012) -
Multifunctional hydrogel nano-probes for atomic force microscopy
by: Lee, Jae Seol, et al.
Published: (2018) -
Effects of pupil filter patterns in line-scan focal modulation microscopy
by: Shen, Shuhao, et al.
Published: (2018)