Nanoscale current spreading analysis in solution-processed graphene oxide/silver nanowire transparent electrodes via conductive atomic force microscopy

Nanoscale current spreading analysis in solution-processed graphene oxide/silver nanowire transparent electrodes via conductive atomic force microscopy

We use conductive atomic force microscopy (CAFM) to study the origin of long-range conductivity in model transparent conductive electrodes composed of networks of reduced graphene oxide (rGOX) and silver nanowires (AgNWs), with nanoscale spatial resolution. Pristine networks of rGOX (1–3 monolayers-...

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Bibliographic Details
Main Authors: Shaw, Joseph E., Perumal, Ajay, Bradley, Donal D. C., Stavrinou, Paul N., Anthopoulos, Thomas D.
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2017
Subjects:
Electrodes
Electrical resistivity
Online Access:https://hdl.handle.net/10356/83589
http://hdl.handle.net/10220/42694

Internet

https://hdl.handle.net/10356/83589
http://hdl.handle.net/10220/42694

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