Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure

Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure

Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperat...

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Bibliographic Details
Main Authors: Ng, Chee Seng, Baek, Jong Dae, Zade, Vishal, Villegas, Adrian, Lee, Tsung-Han, Su, Pei-Chen, Martini, Ashlie, Lee, Min Hwan
Other Authors: School of Mechanical and Aerospace Engineering
Format: Journal Article
Language:English
Published: 2019
Subjects:
DRNTU::Engineering::Mechanical engineering
Measurement
Electrical
Online Access:https://hdl.handle.net/10356/85348
http://hdl.handle.net/10220/48193

Internet

https://hdl.handle.net/10356/85348
http://hdl.handle.net/10220/48193

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