Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure
Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperat...
| Main Authors: | , , , , , , , |
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| 其他作者: | |
| 格式: | Journal Article |
| 語言: | English |
| 出版: |
2019
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| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/85348 http://hdl.handle.net/10220/48193 |
| _version_ | 1826110039182540800 |
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| author | Ng, Chee Seng Baek, Jong Dae Zade, Vishal Villegas, Adrian Lee, Tsung-Han Su, Pei-Chen Martini, Ashlie Lee, Min Hwan |
| author2 | School of Mechanical and Aerospace Engineering |
| author_facet | School of Mechanical and Aerospace Engineering Ng, Chee Seng Baek, Jong Dae Zade, Vishal Villegas, Adrian Lee, Tsung-Han Su, Pei-Chen Martini, Ashlie Lee, Min Hwan |
| author_sort | Ng, Chee Seng |
| collection | NTU |
| description | Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperature electrical and electrochemical studies (up to 700°C) in a conventional AFM setup by employing a combination of a micron-scale heater stage (MHS) and custom-made all-metal tips. We present the design, fabrication process and characterization of the MHS and all-metal tips. A temperature dependent impedance measurement on an MHS-integrated half-cell was then successfully demonstrated with a custom-made Pt-Ir tip. Issues and possible room to improve regarding the new approach are also discussed. |
| first_indexed | 2024-10-01T02:27:58Z |
| format | Journal Article |
| id | ntu-10356/85348 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T02:27:58Z |
| publishDate | 2019 |
| record_format | dspace |
| spelling | ntu-10356/853482023-03-04T17:15:08Z Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure Ng, Chee Seng Baek, Jong Dae Zade, Vishal Villegas, Adrian Lee, Tsung-Han Su, Pei-Chen Martini, Ashlie Lee, Min Hwan School of Mechanical and Aerospace Engineering Interdisciplinary Graduate School (IGS) Energy Research Institute @ NTU (ERI@N) DRNTU::Engineering::Mechanical engineering Measurement Electrical Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperature electrical and electrochemical studies (up to 700°C) in a conventional AFM setup by employing a combination of a micron-scale heater stage (MHS) and custom-made all-metal tips. We present the design, fabrication process and characterization of the MHS and all-metal tips. A temperature dependent impedance measurement on an MHS-integrated half-cell was then successfully demonstrated with a custom-made Pt-Ir tip. Issues and possible room to improve regarding the new approach are also discussed. MOE (Min. of Education, S’pore) Published version 2019-05-14T09:13:29Z 2019-12-06T16:02:09Z 2019-05-14T09:13:29Z 2019-12-06T16:02:09Z 2016 Journal Article Ng, C. S., Baek, J. D., Zade, V., Villegas, A., Lee, T.-H., Su, P.-C., . . . Lee, M. H. (2016). Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure. ECS Transactions, 72(28), 11-20. doi:10.1149/07228.0011ecst 1938-5862 https://hdl.handle.net/10356/85348 http://hdl.handle.net/10220/48193 10.1149/07228.0011ecst en ECS Transactions © 2016 The Electrochemical Society. All rights reserved. This paper was published in ECS Transactions and is made available with permission of The Electrochemical Society. 10 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Mechanical engineering Measurement Electrical Ng, Chee Seng Baek, Jong Dae Zade, Vishal Villegas, Adrian Lee, Tsung-Han Su, Pei-Chen Martini, Ashlie Lee, Min Hwan Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure |
| title | Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure |
| title_full | Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure |
| title_fullStr | Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure |
| title_full_unstemmed | Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure |
| title_short | Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure |
| title_sort | scanning probe based in situ high temperature electrical and electrochemical measurements in atmospheric pressure |
| topic | DRNTU::Engineering::Mechanical engineering Measurement Electrical |
| url | https://hdl.handle.net/10356/85348 http://hdl.handle.net/10220/48193 |
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