Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm

Localization microscopy and multiple signal classification algorithm use temporal stack of image frames of sparse emissions from fluorophores to provide super-resolution images. Localization microscopy localizes emissions in each image independently and later collates the localizations in all the fr...

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Bibliographic Details
Main Authors: Agarwal, Krishna, Macháň, Radek, Prasad, Dilip Kumar
Other Authors: School of Computer Science and Engineering
Format: Journal Article
Language:English
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/10356/87383
http://hdl.handle.net/10220/45392