Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm
Localization microscopy and multiple signal classification algorithm use temporal stack of image frames of sparse emissions from fluorophores to provide super-resolution images. Localization microscopy localizes emissions in each image independently and later collates the localizations in all the fr...
Main Authors: | Agarwal, Krishna, Macháň, Radek, Prasad, Dilip Kumar |
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Other Authors: | School of Computer Science and Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2018
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/87383 http://hdl.handle.net/10220/45392 |
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