Majority and minority voted redundancy scheme for safety-critical applications with error/no-error signaling logic
In the era of nanoelectronics, multiple faults or failures of function blocks are likely to occur. To withstand these, higher levels of redundancy are suggested to be employed in at least the sensitive portions of a circuit or system. In this context, the N-modular redundancy (NMR) scheme may be use...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2018
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/88763 http://hdl.handle.net/10220/46974 |