Parasitic analysis and π-type Butterworth-Van Dyke model for complementary-metal-oxide-semiconductor Lamb wave resonator with accurate two-port Y-parameter characterizations
The parasitic effects from electromechanical resonance, coupling, and substrate losses were collected to derive a new two-port equivalent-circuit model for Lamb wave resonators, especially for those fabricated on silicon technology. The proposed model is a hybrid π-type Butterworth-Van Dyke (PiBVD)...
| Hoofdauteurs: | , , , , , , |
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| Andere auteurs: | |
| Formaat: | Journal Article |
| Taal: | English |
| Gepubliceerd in: |
2018
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| Onderwerpen: | |
| Online toegang: | https://hdl.handle.net/10356/89725 http://hdl.handle.net/10220/47127 |