Pulsed laser scan methodology for single event effect (SEE) qualification

This thesis addresses the need for alternative methods of single event effect (SEE) radiation testing in a period when microelectronic technology nodes are scaling to ever smaller dimensions. This results in increasingly complex devices and compels radiation test engineers to demand radiation test t...

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Bibliographic Details
Main Author: Chua, Chung Tah
Other Authors: Gan Chee Lip
Format: Thesis
Language:English
Published: 2019
Subjects:
Online Access:https://hdl.handle.net/10356/89873
http://hdl.handle.net/10220/47728