Influence of silicon-nanocrystal distribution in SiO2 matrix on charge injection and charge decay

Influence of silicon-nanocrystal distribution in SiO2 matrix on charge injection and charge decay

Influence of distribution of silicon nanocrystals (nc-Si) embedded in SiO2 matrix on charge injection and charge decay of the nc-Si has been investigated with electrostatic force microscopy. For nc-Si distributing in the surface region, the size of charge cloud does not change with decay time, and n...

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Bibliographic Details
Main Authors: Tseng, Ampere A., Ng, Chi Yung, Chen, Tupei, Tse, Man Siu, Fung, Stevenson Hon Yuen, Lim, Vanissa Sei Wei
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2010
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
Online Access:https://hdl.handle.net/10356/90604
http://hdl.handle.net/10220/6355

Internet

https://hdl.handle.net/10356/90604
http://hdl.handle.net/10220/6355

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