Application of Wigner–Ville distribution in electromigration noise analysis

Electromigration noise analysis has shown great potential for the nondestructive evaluation of electromigration performance of metal stripe. However, contradictive conclusions have been published from the electromigration noise analysis. These contradictive conclusions mainly stem from the complex d...

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Bibliographic Details
Main Authors: Tan, Cher Ming, Lim, Shin Yeh
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2009
Subjects:
Online Access:https://hdl.handle.net/10356/91224
http://hdl.handle.net/10220/4655