Charging mechanism in a SiO2 matrix embedded with Si nanocrystals

Charging mechanism in a SiO2 matrix embedded with Si nanocrystals

One of the applications of a Si nanocrystals (nc-Si) embedded in a SiO2 matrix is in the area of nonvolatile memory devices based on the charge storage in the material system. However, whether the charge trapping mainly occurs at the nc-Si/SiO2 interface or in the nc-Si is still unclear. In this wor...

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Bibliographic Details
Main Authors: Fu, Yong Qing, Liu, Yang, Chen, Tupei, Ding, Liang, Zhang, Sam, Fung, Stevenson Hon Yuen
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2010
Subjects:
DRNTU::Engineering::Electrical and electronic engineering
DRNTU::Engineering::Mechanical engineering
Online Access:https://hdl.handle.net/10356/91838
http://hdl.handle.net/10220/6404

Internet

https://hdl.handle.net/10356/91838
http://hdl.handle.net/10220/6404

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