Temporal wavelet analysis for deformation measurement of small components using micro-ESPI
Measuring continuous deformation of specimens whose dimensions are in the range of sub-millimeter introduces a number of difficulties using laser speckle interferometry. During deformation, the speckle patterns recorded on a camera sensor change constantly. These time-dependent speckle patterns woul...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Conference Paper |
| Language: | English |
| Published: |
2010
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/91917 http://hdl.handle.net/10220/6476 |