Temporal wavelet analysis for deformation measurement of small components using micro-ESPI
Measuring continuous deformation of specimens whose dimensions are in the range of sub-millimeter introduces a number of difficulties using laser speckle interferometry. During deformation, the speckle patterns recorded on a camera sensor change constantly. These time-dependent speckle patterns woul...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Conference Paper |
| Language: | English |
| Published: |
2010
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/91917 http://hdl.handle.net/10220/6476 |
| _version_ | 1811687500209455104 |
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| author | Fu, Yu Tay, Cho Jui Quan, Chenggen Chen, Lujie |
| author2 | International Conference on Experimental Mechanics and Conference of the Asian Committee on Experimental Mechanics (3rd : 2005 : Sevilla, Spain) |
| author_facet | International Conference on Experimental Mechanics and Conference of the Asian Committee on Experimental Mechanics (3rd : 2005 : Sevilla, Spain) Fu, Yu Tay, Cho Jui Quan, Chenggen Chen, Lujie |
| author_sort | Fu, Yu |
| collection | NTU |
| description | Measuring continuous deformation of specimens whose dimensions are in the range of sub-millimeter introduces a number of difficulties using laser speckle interferometry. During deformation, the speckle patterns recorded on a camera sensor change constantly. These time-dependent speckle patterns would provide the deformation history of the object. However, compared to large objects, noise effect is much more serious due to the high magnification. In this study, a series of speckle patterns on small objects are captured during deformation by high speed camera and the temporal intensity variation of each pixel is analyzed by a robust mathematical tool --- complex Morlet wavelet transform instead of conventional Fourier transform. The transient velocity and displacement of each point can be retrieved without the need for temporal or spatial phase unwrapping process. Displacements obtained are compared with those from temporal Fourier transform, and the results show that wavelet transform minimize the influence of noise and provide better results. |
| first_indexed | 2024-10-01T05:17:18Z |
| format | Conference Paper |
| id | ntu-10356/91917 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:17:18Z |
| publishDate | 2010 |
| record_format | dspace |
| spelling | ntu-10356/919172020-09-26T22:15:30Z Temporal wavelet analysis for deformation measurement of small components using micro-ESPI Fu, Yu Tay, Cho Jui Quan, Chenggen Chen, Lujie International Conference on Experimental Mechanics and Conference of the Asian Committee on Experimental Mechanics (3rd : 2005 : Sevilla, Spain) Temasek Laboratories DRNTU::Science::Physics::Optics and light Measuring continuous deformation of specimens whose dimensions are in the range of sub-millimeter introduces a number of difficulties using laser speckle interferometry. During deformation, the speckle patterns recorded on a camera sensor change constantly. These time-dependent speckle patterns would provide the deformation history of the object. However, compared to large objects, noise effect is much more serious due to the high magnification. In this study, a series of speckle patterns on small objects are captured during deformation by high speed camera and the temporal intensity variation of each pixel is analyzed by a robust mathematical tool --- complex Morlet wavelet transform instead of conventional Fourier transform. The transient velocity and displacement of each point can be retrieved without the need for temporal or spatial phase unwrapping process. Displacements obtained are compared with those from temporal Fourier transform, and the results show that wavelet transform minimize the influence of noise and provide better results. Published version 2010-11-26T07:46:41Z 2019-12-06T18:14:06Z 2010-11-26T07:46:41Z 2019-12-06T18:14:06Z 2005 2005 Conference Paper Fu, Y., Tay, C. J., Quan, C., & Chen, L. (2005). Temporal wavelet analysis for deformation measurement of small components using micro-ESPI, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics (Singapore): 5852, pp.559-565. https://hdl.handle.net/10356/91917 http://hdl.handle.net/10220/6476 10.1117/12.621664 en Copyright 2005 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. 8 p. application/pdf |
| spellingShingle | DRNTU::Science::Physics::Optics and light Fu, Yu Tay, Cho Jui Quan, Chenggen Chen, Lujie Temporal wavelet analysis for deformation measurement of small components using micro-ESPI |
| title | Temporal wavelet analysis for deformation measurement of small components using micro-ESPI |
| title_full | Temporal wavelet analysis for deformation measurement of small components using micro-ESPI |
| title_fullStr | Temporal wavelet analysis for deformation measurement of small components using micro-ESPI |
| title_full_unstemmed | Temporal wavelet analysis for deformation measurement of small components using micro-ESPI |
| title_short | Temporal wavelet analysis for deformation measurement of small components using micro-ESPI |
| title_sort | temporal wavelet analysis for deformation measurement of small components using micro espi |
| topic | DRNTU::Science::Physics::Optics and light |
| url | https://hdl.handle.net/10356/91917 http://hdl.handle.net/10220/6476 |
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