Extraction of diffusion length using junction-less EBIC

Extraction of diffusion length using junction-less EBIC

The electron-beam-induced current (EBIC) mode...

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Bibliographic Details
Main Authors: Ong, Vincent K. S., Tan, Chee Chin., Radhakrishnan, K.
Other Authors: School of Electrical and Electronic Engineering
Format: Conference Paper
Language:English
Published: 2010
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Online Access:https://hdl.handle.net/10356/92076
http://hdl.handle.net/10220/6339
http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5403693&queryText%3DExtraction+of+Diffusion+Length+Using+Junction-less+EBIC%26openedRefinements%3D*%26searchField%3DSearch+All
http://www.isic2009.org/

Internet

https://hdl.handle.net/10356/92076
http://hdl.handle.net/10220/6339
http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5403693&queryText%3DExtraction+of+Diffusion+Length+Using+Junction-less+EBIC%26openedRefinements%3D*%26searchField%3DSearch+All
http://www.isic2009.org/

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