Silicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuits
Precise measurement of digital circuit degradation is a key aspect of aging tolerant digital circuit design. In this study, we present a fully digital on-chip reliability monitor for high-resolution frequency degradation measurements of digital circuits. The proposed technique measures the beat freq...
Main Authors: | , , |
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Other Authors: | |
Format: | Journal Article |
Language: | English |
Published: |
2010
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/93518 http://hdl.handle.net/10220/6327 |