Robust intermediate read-out for deep submicron technology CMOS image sensors

Robust intermediate read-out for deep submicron technology CMOS image sensors

In this paper, a CMOS image sensor featuring a novel spiking pixel design and a robust digital intermediate read-out is proposed for deep submicron CMOS technologies. The pro...

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Bibliographic Details
Main Authors: Chen, Shoushun, Farid, Boussaid, Amine, Bermak
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2010
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems
Online Access:https://hdl.handle.net/10356/93563
http://hdl.handle.net/10220/6335

Internet

https://hdl.handle.net/10356/93563
http://hdl.handle.net/10220/6335

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