Fracture toughness measurement of thin films on compliant substrate using controlled buckling test

Thin films and multilayered structures are increasingly used in the industry. One of the important mechanical properties of these thin layers is the fracture toughness, which may be quite different from the known value of the bulk sample due to microstructural difference. In the design towards devic...

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Bibliographic Details
Main Authors: Chen, Zhong, Gan, Zhenghao
Other Authors: School of Materials Science & Engineering
Format: Journal Article
Language:English
Published: 2012
Subjects:
Online Access:https://hdl.handle.net/10356/94153
http://hdl.handle.net/10220/8202